a:2:{s:9:"oldRecord";a:2:{s:11:"description";N;s:15:"l10n_diffsource";s:134:"a:7:{s:5:"title";N;s:11:"alternative";N;s:4:"link";N;s:11:"description";N;s:9:"uid_local";N;s:6:"hidden";N;s:16:"sys_language_uid";N;}";}s:9:"newRecord";a:2:{s:11:"description";s:101:"Si vous voulez vérifier la propreté de gaufrettes de silicone - vous mesurez les angles de contact.";s:15:"l10n_diffsource";s:292:"a:8:{s:5:"title";N;s:11:"alternative";N;s:4:"link";s:0:"";s:11:"description";s:100:"Die Reinheit eines Wafers kann einfach und effizient über die Kontaktwinkelmessung bestimmt werden.";s:9:"uid_local";s:2:"32";s:6:"hidden";s:1:"0";s:16:"sys_language_uid";s:1:"0";s:11:"l10n_parent";s:1:"0";}";}}